Method and apparatus for providing primary coincidence correctio

Electricity: measuring and testing – Determining nonelectric properties by measuring electric... – Erosion

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

235 92CP, 23515131, 328112, 328117, 328160, H03K 2130, G06M 1100

Patent

active

039380386

ABSTRACT:
A method and apparatus are disclosed wherein each particle pulse developed in response to passage of particles in a particulate system through a sensing zone is integrated to develop a first voltage whose amplitude varies in accordance with the number of pulses. The pulses are also integrated to develop a second voltage whose amplitude varies in accordance with the duration and, therefore, the size of all of the particle pulses. The first and second voltages are multiplied together to yield an error corrected voltage representing an error corrected particle pulse count, which is then converted to an error corrected particle pulse count.

REFERENCES:
patent: 3737633 (1973-06-01), Collineau
patent: 3864551 (1975-02-01), Oefinger

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for providing primary coincidence correctio does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for providing primary coincidence correctio, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for providing primary coincidence correctio will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-153043

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.