Method and apparatus for providing PCB layout for probe card

Details Method and apparatus for providing PCB layout for probe card Method and apparatus for providing PCB layout for probe card

2006-12-26

2006-12-26

Hollington, Jermele (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010, C324S762010

Reexamination Certificate

active

07154285

ABSTRACT:
An effective and easy to fabricate method to test multiple integrated circuit device designs using a single, probe card design is provided. A universal, probe card design is disclosed herein to test a plurality of integrated circuit devices at the wafer level. Integrated circuit probe pads and probe card probe I/O pins are designed in grid-like pattern on a region of the substrate. Ground terminal encircles the region of the I/O pins and power terminals are provided on the substrate. The I/O terminals can have a constant pitch array or a varying pitch array. The probe card can be used for a family of integrated circuit devices. A method to test flip chip, integrated circuits using a universal probe card has also been disclosed to reduce probe card proliferation and fabrication cost.

REFERENCES:
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patent: 6492832 (2002-12-01), Choi et al.
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“COBRA Vertical Technology Probe Cards”, at http://www.wentworthlabs.com/product/cobra.htm on Apr. 23, 2004, pp. 1-3.

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