Method and apparatus for providing compensation against...

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – With specific source of supply or bias voltage

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C327S544000

Reexamination Certificate

active

11290619

ABSTRACT:
In the present invention an apparatus and method for providing compensation against temperature, process and supply voltage variation in MOS circuits has been proposed. The invention provides a change in process, temperature and voltage detection circuit, which controls the body bias and the drive of the devices in the CMOS circuit. The detection circuit is independent of any input or internal signal of the CMOS circuit to be controlled.

REFERENCES:
patent: 5461338 (1995-10-01), Hirayama et al.
patent: 5610533 (1997-03-01), Arimoto et al.
patent: 5612643 (1997-03-01), Hirayama
patent: 5874851 (1999-02-01), Shiota

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for providing compensation against... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for providing compensation against..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for providing compensation against... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3943316

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.