Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-08-07
2007-08-07
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S076110
Reexamination Certificate
active
10686412
ABSTRACT:
A method and apparatus for selectively providing bandwidth extension and channel matching for acquired signals under test (SUT). The method and apparatus includes a signal acquisition device for acquiring a signal under test (SUT) and generating therefrom a stream of acquired samples, where the signal acquisition device having associated with it a first bandwidth defining a nominal pass band. At least one digital filter imparts a gain equalization function to the acquired SUT samples within a spectral region including and extending beyond the nominal passband. A controller generates a display signal suitable for use by a display device, where the display signal representing waveform imagery associated with the gain equalized SUT.
REFERENCES:
patent: 6542914 (2003-04-01), Pupalaikis
patent: 2004/0223569 (2004-11-01), Hagen et al.
Anderson Rolf
La Voie Marvin E.
Pickerd John J.
Lenihan Thomas F.
Moser Patterson & Sheridan LLP
Raymond Edward
Tektronix Inc.
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