Method and apparatus for profiling structural sections

Details Method and apparatus for profiling structural sections Method and apparatus for profiling structural sections

1983-09-19

1985-01-22

Smith, Alfred E.

X-ray or gamma ray systems or devices

Specific application

Absorption

378 54, 2503591, G01B 1502, G01B 1504

Patent

active

044956355

ABSTRACT:
A system for profiling of structural sections with penetrating radiation in which a head includes a radiation source that projects a fan shaped radiation pattern from one side of the section to be profiled to a diametrically opposite side at which is located an array of detectors. The head is used to detect both attenuation of the rays by the section and the section position, and is not changed or reconfigured for variations in scale. A prior knowledge of the geometric shape of the section permits calculation of total cross-sectional area for weight determination or determination of geometric conformity to a predetermined standard, the calculations being derivable from the individual outputs of the detectors. Compensation for displacement of the profiled article during measurement is also provided.

REFERENCES:
patent: 3108186 (1963-10-01), Flavell, Jr.
patent: 3808437 (1974-04-01), Miyagawa et al.
patent: 3832551 (1974-08-01), Bartlett et al.
patent: 3868510 (1975-02-01), Murata et al.
patent: 3899663 (1975-08-01), Pirlet
patent: 4279513 (1981-07-01), Tucker
patent: 4330835 (1982-05-01), Gehm
Anon., "Thickness Gauge Coupled with Small Control Computer", Monthly Technical Review, 20 (3), Mar. 1976, VEB Vorlag Technik, Germany, p. 65.

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