Method and apparatus for processing holographic interference pat

Details Method and apparatus for processing holographic interference pat Method and apparatus for processing holographic interference pat

1987-05-27

1988-09-06

Willis, Davis L.

Optics: measuring and testing

By particle light scattering

With photocell detection

250550, 356359, 364525, G01B 9023

Patent

active

047688815

ABSTRACT:
A method for accurate phase determination in holographic interferometry using a one- to two-dimensional Fourier transform is described. The method calculates the interference phase pointwise, even between fringe extrema, and thus has advantages over conventional fringe-finding and -tracking methods. Only one interference pattern may be used, although the use of two patterns reconstructed with a mutual phase shift permits an easier phase unwrapping and determination of nonmonotonic fringe-order variations. Additionally, the method offers a means for filtering out disturbances such as speckle noise and background variations.

REFERENCES:
patent: 3874796 (1975-04-01), Chovan et al.
patent: 4690552 (1987-09-01), Grant et al.

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