Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-04-10
2010-12-21
Kundu, Sujoy K (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S067000, C702S070000, C702S071000, C702S073000, C702S074000, C702S075000, C702S076000, C073S38200R, C073S38200R
Reexamination Certificate
active
07856329
ABSTRACT:
A method of processing data acquired by under-sampling a chirped, sinusoidal waveform comprises complex-heterodyning the under-sampled data with a chirped signal having characteristics similar to the sinusoidal waveform to generate a demodulated signal and analyzing the demodulated signal to determine characteristics of the sinusoidal waveform.
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patent: 2006/0193372 (2006-08-01), McCorkle et al.
Niebauer, et al., “A New Generation of Absolute Gravimeters,”Metrologia, vol. 32 (3), pp. 159-180, 1995.
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D'Agostino, et al., “A Method to Estimate the Time-Position Coordinates of a Free Falling Test-Mass in Absolute Gravimetry,”Metrologia, 42 (2005) 233-238.
Niebauer Tim
Schiel Aaron
Westrum Derek Van
Connolly Bove & Lodge & Hutz LLP
Kundu Sujoy K
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