Method and apparatus for processing a sampled waveform

Details Method and apparatus for processing a sampled waveform Method and apparatus for processing a sampled waveform

1996-08-29

1998-10-27

Voeltz, Emanuel Todd

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

702 67, 324 7615, 324 7617, 324 7638, G01R 1334

Patent

active

058289836

ABSTRACT:
A method and apparatus are provided for approximation of integral and RMS values for waveforms of uncertain or unknown period. The technique employed processes values of the waveform sampled at fixed sampling intervals, monitors the actual period of the waveform, and calculates the number of fixed sampling intervals in the period. The sampled data is then used as a basis for mapping the waveform onto a desired number of sampling points. Interpolation techniques are used to assign values to desired sampling points lying between fixed interval sampled points. The desired number of sample points is selected to permit use of Simpson's rule for approximating the integral value (an odd number of points for application of Simpson's 1/3 rule, and a number equal to a multiple of 3 plus 1 for application of Simpson's 3/8 rule). Once the desired sampling points are determined, Simpson's rule is applied to calculate the integral, and the RMS value may be determined based on this integral value.

REFERENCES:
patent: 5235534 (1993-08-01), Potter
patent: 5378979 (1995-01-01), Lombardi
patent: 5498956 (1996-03-01), Kinney et al.
patent: 5528134 (1996-06-01), Davis et al.
patent: 5627718 (1997-05-01), Engel et al.

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