Method and apparatus for probing an electronic device in...

Details Method and apparatus for probing an electronic device in... Method and apparatus for probing an electronic device in...

2007-05-15

2007-05-15

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S757020, C324S758010

Reexamination Certificate

active

10781369

ABSTRACT:
An electronic device is moved into a first position such that terminals of the electronic device are adjacent probes for making electrical contact with the terminals. The electronic device is then moved horizontally or diagonally such that the terminals contact the probes. Test data are then communicated to and from the electronic device through the probes.

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