Electric heating – Heating devices – With power supply and voltage or current regulation or...
Reexamination Certificate
2006-05-04
2011-11-29
Paschall, Mark (Department: 3742)
Electric heating
Heating devices
With power supply and voltage or current regulation or...
C219S494000, C219S497000, C324S756030, C324S754100, C324S754080
Reexamination Certificate
active
08067718
ABSTRACT:
A probe comprises a small “consumable” probe substrate permanently mounted to a circuit-under-test. The probe substrate includes a high-fidelity signal pathway, which is inserted into a conductor of the circuit-under-test, and a high-bandwidth sensing circuit which senses the signal-under-test as it propagates along the signal pathway. The probe substrate further includes a probe socket for receiving a detachable interconnect to a measurement instrument. Power is alternatively supplied to the probe by the circuit-under-test or the interconnect. When the interconnect is attached, control signals from the measurement instrument are supplied to the sensing circuit and the output of the sensing circuit is supplied to the measurement instrument. In one embodiment, the sensing circuit uses high-breakdown transistors in order to avoid the use of passive attenuation. In a further embodiment, the sensing circuit includes broadband directional sensing circuitry.
REFERENCES:
patent: 3872408 (1975-03-01), Reilly
patent: 3934213 (1976-01-01), Stuckert
patent: 5058198 (1991-10-01), Rocci et al.
patent: 5343172 (1994-08-01), Utsu et al.
patent: 5425052 (1995-06-01), Webster
patent: 6066994 (2000-05-01), Sheperd
patent: 6242933 (2001-06-01), Yap
patent: 6337571 (2002-01-01), Maddala
patent: 6552523 (2003-04-01), Huard
patent: 6624721 (2003-09-01), Hagen
patent: 6956448 (2005-10-01), Willems
patent: 2002/0158639 (2002-10-01), Nakashiba
patent: 2004/0046581 (2004-03-01), Maekawa et al.
Law William Q.
Nightingale Mark W.
Nordstrom Robert A.
Pollock Ira G.
Traa Einar O.
Bucher William K.
Nelson Michael A.
Paschall Mark
Tektronix Inc.
LandOfFree
Method and apparatus for probing does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for probing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for probing will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4298614