Method and apparatus for preparing specimens for destructive tes

Measuring and testing – Sampler – sample handling – etc. – Flow divider – deflector – or interceptor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

7386441, 83919, 156256, G01N 128

Patent

active

049341995

ABSTRACT:
A method of preparing specimens of composite material for destructive testing is disclosed. A panel from which the specimens are to be cut is cut from a sheet of composite material. The panel is cut from the sheet by first cutting the sheet along a line to form an alignment edge. The alignment edge is placed against a fence and the panel is cut with a first saw blade to a predetermined width and length. A first set of pads is placed on a fitting, the pads being spaced apart by a predetermined distance by a plurality of pins extending from the fitting. The panel is placed on top of the pads. A second set of pads is placed on top of the panel. The fitting is clamped to a table. The table moves into the path of a second saw blade which cuts the panel in a first direction. The fitting is rotated and the table is moved into the path of the second saw blade again to cut the specimens. The smoothness of the surface cut by the second saw blade is significantly smoother than the smoothness of the first saw blade. Providing smooth surfaces on the specimen aids in ensuring that destructive testing of the specimen provides an accurate measure of the quality of the material.

REFERENCES:
patent: 3227024 (1966-01-01), Krebs
patent: 3791903 (1974-02-01), Omi et al.
patent: 3977449 (1976-08-01), Sadashige
patent: 4006051 (1977-02-01), Board, Jr.
patent: 4517040 (1985-05-01), Whitted
patent: 4629629 (1986-12-01), David
English Abstract of Japanese Patent Document No. 55-10793S by Patent Abstracts of Japan; ABS Grp, No. P035, Abs. vol. No. 4, No. 160, ABS Pub. Date Nov. 8, 1980 (Patent Document Published Aug. 19, 1980).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for preparing specimens for destructive tes does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for preparing specimens for destructive tes, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for preparing specimens for destructive tes will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2251797

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.