Method and apparatus for preparing measurement specifications of

Details Method and apparatus for preparing measurement specifications of Method and apparatus for preparing measurement specifications of

1989-03-22

1991-05-28

Gruber, Felix D.

Boots, shoes, and leggings

364489, 371 27, G01R 3128

Patent

active

050200097

ABSTRACT:
A method for preparing the measurement specifications of an electronic circuit comprises the steps of preparing testing peripheral circuit diagrams for individual measurement items by adding standardized testing peripheral circuit modules to the basic peripheral circuit diagram of the electronic circuit, preparing an overall testing peripheral circuit diagram for use in making measurements corresponding to all the measurement items by synthesizing these testing peripheral circuit diagrams with one another, and preparing measurement specifications for individual measurement items for use in making measurements employing the overall testing peripheral circuit diagram, from the overall testing peripheral circuit diagram and the testing peripheral circuit diagrams. An apparatus for carrying out such a method has an input device, a data base, a section for preparing testing peripheral circuit diagrams for individual measurement items, a section for preparing an overall testing peripheral circuit diagram by synthesization, a section for preparing measurement specifications for individual measurement items, and an output device for outputting the measurement specifications thus prepared.

REFERENCES:
patent: 3622762 (1971-11-01), Dyer
patent: 4550406 (1985-10-01), Neal
patent: 4584653 (1986-04-01), Chih et al.
patent: 4612618 (1986-09-01), Pryor et al.
patent: 4613940 (1986-09-01), Shenton et al.
patent: 4638442 (1987-01-01), Bryant et al.
patent: 4862399 (1989-08-01), Freeman
House, "Development System Lays Basis for Fully Integrated VLSI Design Center", Electronics (2/28/80), vol. 53, No. 5, pp. 143-147.
Groner, "Computer Aided Design of VLSI Saves Man-Hours, Reduces Errors", Control Engineering (Apr. 1981), pp. 55-57.
Trimberger, "Automating Chip Layout", IEEE Spectrum, Jan. 1982) pp. 38-45.

Affiliated with

Also associated with

Rating

Method and apparatus for preparing measurement specifications of does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for preparing measurement specifications of, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for preparing measurement specifications of will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-40701