Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-01-31
2006-01-31
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S034000, C702S010000, C324S537000
Reexamination Certificate
active
06993446
ABSTRACT:
A method and apparatus are disclosed for determining a time to failure for an electronic device. The method and apparatus includes estimating a dependency of a bond strength degradation rate on at least one parameter and estimating a temperature profile of the electronic device. Furthermore, the method and apparatus determine a bond strength based on the dependency of the bond strength degradation rate and the temperature profile, and determine the time to failure for the electronic device based on a time evolution of the bond strength.
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Etchells Richard K.
Gunawardana Ruvinda
Baran Mary Catherine
Gaudier Dale V.
Hoff Marc S.
Schlumberger Technology Corporation
Segura Victor H.
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