Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2006-02-28
2006-02-28
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C702S185000, C703S002000, C714S047300
Reexamination Certificate
active
07006947
ABSTRACT:
The invention regards a system reliability or failure predicting apparatus and method that incorporates known information about system component failure into a system model and uses the model with or without other acquired system data to predict the probability of system failure. An embodiment of the method includes using probabilistic methods to create a system failure model from the failure models of individual system components, predicting the failure of the system based on the component models and system data, ranking the sensitivity of the system to the system variables, and communicating a failure prediction.
REFERENCES:
patent: 4707796 (1987-11-01), Calabro et al.
patent: 4766595 (1988-08-01), Gollomp
patent: 4985857 (1991-01-01), Bajpai et al.
patent: 5210704 (1993-05-01), Husseiny
patent: 5331579 (1994-07-01), Maguire, Jr. et al.
patent: 5465321 (1995-11-01), Smyth
patent: 6085154 (2000-07-01), Leuthausser et al.
patent: 6199018 (2001-03-01), Quist et al.
patent: 6226597 (2001-05-01), Eastman et al.
patent: 6311096 (2001-10-01), Saxena et al.
patent: 6405108 (2002-06-01), Patel et al.
patent: 6519763 (2003-02-01), Kaufer et al.
Tryon et al., “A Reliability-Based Model to Predict Scatter in Fatigue Crack Nucleation Life”, Fatigue & Fracture of Engineering Materials & Structures 21:257-267 (© 1998 Blackwell Science Ltd.).
Tryon et al., “Probabilistic Mesomechanical Fatigue Crack Nucleation Model”, Journal of Engineerig Materials and Technology, 119:65-69 (Jan. 1997).
Tryon, “Probabilistic Mesomechanical Fatigue Model”, NASA Technical Report NASA/CR-97-202342, Apr. 1997, pp. 1-30.
Dey Animesh
Nasser A. Lorenz
Tryon, III Robert G.
Baran Mary Catherine
Fish & Richardson P.C.
Hoff Marc S.
Vextec Corporation
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