Method and apparatus for positioning a test head on a...

Details Method and apparatus for positioning a test head on a... Method and apparatus for positioning a test head on a...

2006-11-07

2006-11-07

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S758010, C324S1540PB

Reexamination Certificate

active

07132843

ABSTRACT:
A method and apparatus for positioning a test head with respect to a printed circuit board. Adjusting marks having two parts, a frame and a mark positioned within a region enclosed by the frame, are provided on the printed circuit board. The frame and the mark within the frame are at a defined potential, which may be measured by the test head. Methods for positioning the test head are provided whereby the test head is initially positioned within an area bounded by the frame of the first adjusting mark and the test head is then re-positioned via a search algorithm which determines the coordinates of the mark within the region enclosed by the frame; the steps of positioning and repositioning of the test head are repeated at a second adjusting mark, and the determined coordinates are used to determine positioning of the test head.

REFERENCES:
patent: 4626907 (1986-12-01), Schedewie
patent: 5768107 (1998-06-01), Ouchi et al.
patent: 6293007 (2001-09-01), Kuriyama et al.
patent: 6480012 (2002-11-01), Komori
patent: 6612159 (2003-09-01), Knutrud
patent: 199 15 052 (2000-10-01), None
patent: 101 39 755 (2002-03-01), None

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