Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1996-12-06
1998-08-18
Font, Frank G.
Optics: measuring and testing
By particle light scattering
With photocell detection
356363, 356401, 250548, G01B 902
Patent
active
057964831
ABSTRACT:
Using an LIA alignment sensor, consecutive sensings of a reference-mark position are taken. I(.omega.), the power spectrum of the fluctuations of these sensings in a time period is computed. I'(.omega.), the power spectrum of the averaged fluctuations for an averaging time .DELTA.T that changes between two different measurement times .DELTA.T1 and .DELTA.T2 is then computed. The dispersion of the data averaged during this averaging time .DELTA.T matches the integral of the power spectrum I'(.omega.). The time period during which the value of the integral of the power spectrum I'(.omega.) reaches its lowest value is used as the measurement time of the position based on the beat signal obtained by the alignment sensor.
REFERENCES:
patent: 4710026 (1987-12-01), Magome et al.
patent: 4856905 (1989-08-01), Nishi
patent: 5151750 (1992-09-01), Magome et al.
Font Frank G.
Kim Robert
Meller Michael N.
Nikon Corporation
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