Method and apparatus for polarization-sensitive optical...

Optics: measuring and testing – By light interference

Reexamination Certificate

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C600S473000, C600S476000, C356S451000, C356S453000, C356S364000

Reexamination Certificate

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07826059

ABSTRACT:
A method and apparatus for extracting the vector optical properties of biological samples with micron-scale resolution in three dimensions, using polarization-sensitive optical coherence tomography (PS-OCT). The method measures net retardance, net fast axis, and reflectivity. Polarization sensing is accomplished by illuminating the sample with at least three separate polarization states, using consecutive acquisitions of the same pixel, A-scan, or B-scan. The method can be implemented using non-polarization-maintaining fiber and a single detector. This PS-OCT method reported measures fast axis explicitly. In a calibration test of the system, net retardance was measured with an average error of 7.5° (standard deviation 2.2°) over the retardance range 0° to 180°, and fast axis with average error of 4.8° over the range 0° to 180°.

REFERENCES:
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patent: WO00/69333 (2000-11-01), None
patent: WO0069333 (2000-11-01), None
Podoleanu A.G. et al: “Simultaneous En-Face Imaging of Two Layers in the Human Retina by Low-Coherence Reflectometry”, Optics Letters, Optical Society of America, Washington, US, vol. 22, No. 13, Jul. 1, 1997, pp. 1039-1041, XP000658709.
Podoleanu A.G. et al: “Simultaneous Low Coherence Interferometry Imaging At Two Depths Using an Integrated Optic Modulator”, Optics Communications, North-Holland Publishing Co., Amsterdam, NL, vol. 191, No. 1-2, May 1, 2001, pp. 21-30, XP004234990.
Everett M.J. et al:“Non-invasive Diagnosis of Early Caries With Polarization Sensitive Optical Coherence Tomography”, Proceedings of the SPIE, SPIE, Bellingham, VA, us, vol. 3593, Jan. 24, 1999, pp. 177-182, XP000931184, Chapter 3, pp. 178-179, Figure 1.
Boer De J.F. et al: “Polarization Effects in Optical Coherence Tomography of Various Biological Tissues”, IEEE Journal of Selected Topics in Quantum Electronics, IEEE Service Center, US., vol. 5, No. 4, Jul. 1999, pp. 1200-1203, XP00893469, Chapter III, pp. 1200-1201, Figure 1.

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