Method and apparatus for photoinductive imaging

Details Method and apparatus for photoinductive imaging Method and apparatus for photoinductive imaging

1989-07-21

1990-08-21

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Magnetic

With temperature control of material or element of test circuit

324202, 324226, 324262, 356432, 374 4, 374 45, G01R 3500, G01R 3100, G01N 2714, G01N 2720

Patent

active

049509900

ABSTRACT:
A system for photoinductive imaging for flaw detection of materials and for calibrating eddy-current probes includes positioning an eddy-current probe adjacent to a specimen to be analyzed or to be used as a calibration fixture. A source of thermal energy is modulated and focused to a localized area on the specimen. Thermal energy is then scanned across at least a portion of the detection area of the eddy-probe. The resulting signal from the eddy-current probe is recorded and can depict either thermal-influenced components of the specimen or the response pattern of the eddy-current probe. The record can therefore be used to image flaws or physical holes or shapes of the specimen or calibrate the eddy-current probe.

REFERENCES:
patent: 4513384 (1985-04-01), Rosenwaig
patent: 4581576 (1986-04-01), Wang

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