Optics: measuring and testing – Of light reflection
Patent
1980-05-08
1982-08-17
McGraw, Vincent P.
Optics: measuring and testing
Of light reflection
356446, 356448, G01N 2155, G01N 2147
Patent
active
043447090
ABSTRACT:
A method and apparatus for photogoniometric analysis of surfaces is disclosed. A photogoniometric instrument includes a light source (12) for providing a collimated beam of light illuminating a test surface (18). A light detector (20) is mounted for rotation about the point of intersection of the illuminating beam on the test surface. A motor (44) drives the detector through a range of reflectance angles, and a microcomputer (52) digitizes the detector output periodically, storing the digitized data words in its memory (68). These stored words define a photogoniometric curve (FIG. 2A) including a specular portion (FIG. 2D) and a nonspecular, or diffuse, portion (FIG. 2C). A host computer (62) receives the photogoniometric data from the microcomputer, deconvolutes the data into spectral and diffuse portions, and analyzes the two portions separately from one another. To accomplish this deconvolution, the host computer subtracts from the photogoniometric data the actual reflectance characteristic of a standard surface whose characteristic lacks the specular peak. This diffuse standard reflectance characteristic is stored in the host computer memory in the form of a mathematical equation which has been curve fitted to the actual reflectance characteristics of the diffused standard.
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Holsworth Richard M.
Koehler Mark E.
Provder Theodore
McGraw Vincent P.
SCM Corporation
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