Thermal measuring and testing – Differential thermal analysis
Patent
1996-05-17
1998-08-04
Bennett, G. Bradley
Thermal measuring and testing
Differential thermal analysis
374 43, G01N 2500
Patent
active
057883734
ABSTRACT:
A method and apparatus for performing single differential thermal analysis of a sample relative to a reference, using either one reference measurement for a sequence of material measurements--whereby the reference can also be represented by an empty weighing pan--or by the use of a mathmematical model which is so determined that it takes the real behavior of the thermal analytical apparatus into account. Reference temperature curves are generated relative to time of an empty furnace or a reference sample contained in the furnace, and temperature curves of a sample to be measured are taken at the exact same location in the furnace. The reference and sample temperature curves are compared to determine the temperature difference. The reference temperature curve can be calculated mathematically from the measured furnace temperature and the heat transmission factor between the furnace temperature and the temperature of the location of the sample in the furnace, whereby it is possible to determine the differential thermal analysis by a single measurement.
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of Thermal Analysis!, Springer Publishers 1989, from the series entitled Guidelines for Chemical Laboratory Practice.
Huetter Thomas
Joerimann Urs
Wiedemann Hans-Georg
Bennett G. Bradley
Mettler-Toledo GmbH
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