Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2007-08-14
2007-08-14
Lee, Hwa (Andrew) (Department: 2886)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S489000
Reexamination Certificate
active
10970485
ABSTRACT:
The invention is an apparatus and method for second harmonic optical coherence tomography of a sample comprising a laser coupled to an interferometer which has a reference arm and in a sample arm. A nonlinear crystal in the reference arm generates a second harmonic reference signal. The sample typically backscatters some second harmonic light into the sample arm. A broadband beam splitter optically coupled to the reference arm and sample arm combines the signals from the reference arm and sample arm into interference fringes and a dichroic beam splitter splits the interference fringes into a fundamental and second harmonic interference signal. A detector is optically coupled to the dichroic beam splitter detects interference fringes from which both an OCT and second harmonic OCT image can be constructed using a conventional data processor.
REFERENCES:
patent: 6608717 (2003-08-01), Medford et al.
patent: 6611339 (2003-08-01), Yang et al.
Chen Zhongping
Jang Yi
Lee Hwa (Andrew)
Myers Dawes Andras & Sherman LLP
The Regents of the University of California
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