Method and apparatus for performing multi-site integrated...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C702S089000, C702S118000

Reexamination Certificate

active

06941232

ABSTRACT:
Disclosed herein is an improved method and apparatus for simultaneously performing tests on several devices at the same time. An aspect of one embodiment of the invention is an improved DMA controller that automatically selects certain pin groups, which are connected to a common data bus, to receive test data words from a common data bus. By selecting more than one pin group at the same time, test data (such as a test data word) can be simultaneously loaded onto multiple pin cards at the same time. By loading this data into multiple pin cards at the same time, test data can be “fanned-out” to multiple pin cards and thereby be sent to multiple device sites at the same time. Another aspect of one embodiment of the invention utilizes DMA-based hardware to select which pin groups should received “fanned-out” test data. By utilizing DMA-based hardware to fan-out the test data, the software-based test programs and patterns may be created to manipulate a single device. The test program may select the number of sites to be tested and partition the tester resources to those sites. The DMA-based hardware and tester software will automatically fan-out the test data to all of the appropriate test sites.

REFERENCES:
patent: 5666049 (1997-09-01), Yamada et al.
patent: 6145104 (2000-11-01), Feddeler et al.
patent: 6363510 (2002-03-01), Rhodes et al.
patent: 6477685 (2002-11-01), Lovelace
patent: 6574760 (2003-06-01), Mydill
patent: 2002/0021140 (2002-02-01), Whetsel
patent: 0 283 186 (1988-09-01), None
Bedsole et al., “Very Low Cost Testers: Opportunities and Challenges”, IEEE Design & Test of Computers, Sep.-Oct. 2001.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for performing multi-site integrated... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for performing multi-site integrated..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for performing multi-site integrated... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3428825

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.