Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-09-06
2005-09-06
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S089000, C702S118000
Reexamination Certificate
active
06941232
ABSTRACT:
Disclosed herein is an improved method and apparatus for simultaneously performing tests on several devices at the same time. An aspect of one embodiment of the invention is an improved DMA controller that automatically selects certain pin groups, which are connected to a common data bus, to receive test data words from a common data bus. By selecting more than one pin group at the same time, test data (such as a test data word) can be simultaneously loaded onto multiple pin cards at the same time. By loading this data into multiple pin cards at the same time, test data can be “fanned-out” to multiple pin cards and thereby be sent to multiple device sites at the same time. Another aspect of one embodiment of the invention utilizes DMA-based hardware to select which pin groups should received “fanned-out” test data. By utilizing DMA-based hardware to fan-out the test data, the software-based test programs and patterns may be created to manipulate a single device. The test program may select the number of sites to be tested and partition the tester resources to those sites. The DMA-based hardware and tester software will automatically fan-out the test data to all of the appropriate test sites.
REFERENCES:
patent: 5666049 (1997-09-01), Yamada et al.
patent: 6145104 (2000-11-01), Feddeler et al.
patent: 6363510 (2002-03-01), Rhodes et al.
patent: 6477685 (2002-11-01), Lovelace
patent: 6574760 (2003-06-01), Mydill
patent: 2002/0021140 (2002-02-01), Whetsel
patent: 0 283 186 (1988-09-01), None
Bedsole et al., “Very Low Cost Testers: Opportunities and Challenges”, IEEE Design & Test of Computers, Sep.-Oct. 2001.
Burke, Jr. Dennis Harold
Martel Michael Lee
Patel Gunvant T.
Brady III Wade James
Cherry Stephen J.
Nghiem Michael
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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