Thermal measuring and testing – Determination of inherent thermal property
Patent
1997-04-21
2000-08-01
Gutierrez, Diego
Thermal measuring and testing
Determination of inherent thermal property
374 11, G01N 2520, G01N 2518
Patent
active
060956798
ABSTRACT:
A platinum/Rhodium resistance thermal probe is used as an active device which acts both as a highly localized heat source and as a detector to perform localized differential calorimetry, by thermally inducing and detecting events such as glass transitions, meltings, recystallizations and thermal decomposition within volumes of material estimated at a few .mu.m.sup.3. Furthermore, the probe is used to image variations in thermal conductivity and diffusivity, to perform depth profiling and sub-surface imaging. The maximum depth of the sample that is imaged is controlled by generating and detecting evanescent temperature waves in the sample.
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Hammiche Azzedine
Pollock Hubert Murray Montagu
Reading Michael
Song Mo
Gutierrez Diego
TA Instruments
Tibbits Pia
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