Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate
2011-04-26
2011-04-26
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Physical design processing
C716S106000, C716S107000, C716S110000, C716S112000, C716S126000, C703S013000, C703S019000
Reexamination Certificate
active
07934187
ABSTRACT:
Method, apparatus, and computer readable medium for performing electrical rule checks (ERCs) on a circuit design are described. In one example, a hierarchy of cell instances is created from a schematic database for the circuit design. The hierarchy is traversed to produce master nets. Each of the master nets is associated with shorted nets in the circuit design. The hierarchy is traversed to produce ERC nets. Each of the ERC nets is associated with effectively shorted nets in the circuit design. At least one pair of the effectively shorted nets is effectively shorted across a transistor. At least one ERC is performed on the circuit design using the master nets and the ERC nets.
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Brush Robert M.
Dinh Paul
George Thomas
Nguyen Nha T
Xilinx , Inc.
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