Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Patent
1997-11-03
2000-04-11
Hoff, Marc S.
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
360 46, 360 51, 360 67, 360 75, 714769, 714799, 714814, 714819, G11B 2010, G11B 502
Patent
active
060497637
ABSTRACT:
An improved thermal asperity detector is disclosed for detecting short thermal asperities using a variable time threshold. The thermal asperity detector includes a saturation detector, and a comparator system. The comparator system may include a polarity latch, a processor, a level comparator and a timing comparator. The saturation detector compares a programmable saturation threshold to an A/D sample to generate an enable signal in response to the A/D sample exceeding the saturation threshold. The polarity latch receives the A/D sample and the enable signal, and records the most significant bit of the A/D sample to identify the polarity of the saturation and to provide an output signal representative thereof in response to the enable signal. The processor generates a threshold level control signal based upon a programmable level threshold and the polarity latch output signal. The level comparator compares the A/D sample and the output from the polarity latch in response to the enable signal, and generates a timing output signal to a timing comparator in response to the comparison of the A/D sample and the output from the polarity latch. The timing output signal represents a number of succeeding A/D samples that surpasses the dynamically shifted level threshold. The timing comparator compares the timing output signal from the level comparator and a programmable time threshold in response to the enable signal. Finally, the timing comparator generates a thermal asperity indication when the succeeding A/D samples surpass the dynamically shifted level threshold for the programmable time threshold.
REFERENCES:
patent: 5233482 (1993-08-01), Galbraith et al.
patent: 5751510 (1998-05-01), Smith et al.
patent: 5844920 (1998-12-01), Zook et al.
Galbraith, R. L., et al., "Ditigal Thermal Asperity Detection", IBM.RTM. Technical Disclosure Bulletin, 34(6):338-339 (Nov. 1991), .COPYRGT.IBM Corp., 1991.
Christiansen Grant Stolpe
Vosberg Donald Earl
Hoff Marc S.
International Business Machines - Corporation
Lynch David W.
Vo Hien
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