Method and apparatus for performing baking treatment to...

Electric heating – Heating devices – Combined with container – enclosure – or support for material...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C219S405000, C219S411000, C392S416000, C392S418000, C118S724000, C118S725000, C118S501000

Reexamination Certificate

active

06838643

ABSTRACT:
An apparatus for baking a semiconductor wafer having a resist pattern thereon includes a baking oven in which the semiconductor wafer is placed and heated, and a first hot plate which is provided in the baking oven to heat an entire bottom surface of the semiconductor wafer. The apparatus also includes a gas supply unit having a gas introducing path, through which the purge gas is introduced into the baking oven, and a gas exhaust path, through which the purge gas is exhausted out of the baking oven. A gas temperature controller controls a temperature of the purge gas in order that the purge gas flowing around a peripheral edge or outer portion of the wafer has a higher temperature than that around the center or inner portion of the wafer.

REFERENCES:
patent: 6033474 (2000-03-01), Mita et al.
patent: 6402844 (2002-06-01), Harada et al.
patent: 11-204402 (1999-07-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for performing baking treatment to... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for performing baking treatment to..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for performing baking treatment to... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3383988

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.