Method and apparatus for pattern analysis

Details Method and apparatus for pattern analysis Method and apparatus for pattern analysis

1974-05-13

1976-11-23

Boudreau, Leo H.

Communications: electrical

Digital comparator systems

250550, 350162SF, G06K 900

Patent

active

039939766

ABSTRACT:
A technique and apparatus for two dimensional pattern analysis utilizing a transform of the pattern enables the extraction of desired pattern information by means of spatial filtering in accordance with known human visual system processing. Two dimensional spatial frequencies resulting from the transform are acted on by either anisotropic or uniquely used conventional filters to extract one, two and three dimensional pattern information from spatial frequency subsets to determine general form, edge, texture and depth information for detection, identification and classification of objects in simple or complex scenes.

REFERENCES:
patent: 3563634 (1971-02-01), Parks et al.
Stromeyer III et al., "Spatial-Frequency Masking in Vision," Journal of the Optical Society of America, (vol. 62, No. 10), Oct. 1972, pp. 1221-1232.
Schneider et al., "Spatial Frequency Range Scanning Using a Zoom Objective," Applied Optics, (vol. 11, No. 8), Aug., 1972, p. 1875.

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