Method and apparatus for passing charge from word lines...

Static information storage and retrieval – Addressing – Particular decoder or driver circuit

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S204000, C365S189090

Reexamination Certificate

active

11014258

ABSTRACT:
A plasma damage protection circuit includes a word line driver circuit with plasma damage protection features. If, during manufacture, plasma-based processes cause charge to build up on the word lines, the charge passes from the word lines through at least the word line drivers to the semiconductor substrate. Another plasma-based protection circuit includes a device coupled to multiple word line drivers. If, during manufacture, plasma-based processes cause charge to build up on the word lines, the charge passes from the word lines through at least the device to the semiconductor substrate. Thus, these plasma-based protection circuits save space while protecting the integrated circuit from plasma process-based damage.

REFERENCES:
patent: 4528583 (1985-07-01), te Velde et al.
patent: 4635230 (1987-01-01), Thomas et al.
patent: 4654824 (1987-03-01), Thomas et al.
patent: 4669180 (1987-06-01), Thomas et al.
patent: 5466622 (1995-11-01), Cappelletti
patent: 5548146 (1996-08-01), Kuroda et al.
patent: 5559368 (1996-09-01), Hu et al.
patent: 5691234 (1997-11-01), Su et al.
patent: 5760445 (1998-06-01), Diaz
patent: 5776807 (1998-07-01), Ronkainen et al.
patent: 5913120 (1999-06-01), Cappelletti
patent: 5962888 (1999-10-01), Kim et al.
patent: 5963412 (1999-10-01), En
patent: 5985709 (1999-11-01), Lee et al.
patent: 5994742 (1999-11-01), Krishnan et al.
patent: 5998299 (1999-12-01), Krishnan
patent: 6034433 (2000-03-01), Beatty
patent: 6043123 (2000-03-01), Wang et al.
patent: 6046956 (2000-04-01), Yabe
patent: 6060347 (2000-05-01), Wang
patent: 6066879 (2000-05-01), Lee et al.
patent: 6080658 (2000-06-01), Huang et al.
patent: 6113648 (2000-09-01), Schuelein et al.
patent: 6166584 (2000-12-01), De
patent: 6172392 (2001-01-01), Schmidt et al.
patent: 6218895 (2001-04-01), De et al.
patent: 6252280 (2001-06-01), Hirano
patent: 6261878 (2001-07-01), Doyle et al.
patent: 6277723 (2001-08-01), Shih et al.
patent: 6291281 (2001-09-01), Wang et al.
patent: 6300819 (2001-10-01), De et al.
patent: 6306691 (2001-10-01), Koh
patent: 6307233 (2001-10-01), Awaka et al.
patent: 6313503 (2001-11-01), Lee et al.
patent: 6320423 (2001-11-01), Sato
patent: 6323076 (2001-11-01), Wilford
patent: 6365938 (2002-04-01), Lee et al.
patent: 6388498 (2002-05-01), Moriwaki et al.
patent: 6437408 (2002-08-01), Shih et al.
patent: 6466489 (2002-10-01), Ieong et al.
patent: 6468848 (2002-10-01), Awaka et al.
patent: 6512700 (2003-01-01), McPartland et al.
patent: 6534833 (2003-03-01), Duvvury et al.
patent: 6624480 (2003-09-01), Lin et al.
patent: 6664140 (2003-12-01), Lee et al.
US 6,342,723, 01/2002, Wilford (withdrawn)

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for passing charge from word lines... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for passing charge from word lines..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for passing charge from word lines... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3791404

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.