Optics: measuring and testing – For size of particles
Patent
1987-09-15
1989-12-12
Willis, Davis L.
Optics: measuring and testing
For size of particles
356345, G01B 902, G01N 1502
Patent
active
048863602
ABSTRACT:
The apparatus comprises a cell 2 containing the sample 1 under investigation. Electromagnetic waves P1,P2 are applied from opposite directions and interfere with one another in the region of the cell to form a standing wave pattern 6. DUe to electrostriction effects the standing wave pattern causes particles within the sample to concentrate in certain areas in a pattern corresponding to that of the standing wave 6. This pattern of particle concentration forms a grating when seen by an input wave Pin of electromagnetic wave radiation and, provided conditions are correct, results in the generation of a phase conjugate wave Pout. Means (not shown) are provided for measuring the intensity of the phase conjugate wave Pout which gives a sensitive measure of the size of the particles suspended in the sample.
REFERENCES:
patent: 4622642 (1986-11-01), Bajard et al.
Witherow, "A high resolution holographic particle sizing system", Optical Engineering, vol. 18, No. 3, pp. 249-255, 6/79.
Amersham International plc
Koren Matthew W.
Willis Davis L.
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