Excavating
Patent
1996-07-02
1997-04-22
Beausoliel, Jr., Robert W.
Excavating
371 225, 371 221, 371 251, G01R 3128
Patent
active
056235038
ABSTRACT:
Partial-Scan testing of an integrated circuit (10) having a Boundary-Scan architecture (18) is accomplished by way of a Partial-Scan controller (36) contained within the integrated circuit. In response to control signals generated by Boundary-Scan architecture (18), the Partial-Scan controller (36) generates a set of Partial-Scan control signals for causing the integrated circuit to accomplish Partial-Scan testing. In this way, the Partial-Scan control signals necessary to accomplish Partial-Scan testing are generated internally, rather than requiring a separate set of input pins to receive the Partial-Scan control signals from an external source.
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IEEE Standard Test Access Port and Boundary-Scan Architecture, May 1990, Ch. 5, pp. 5-1 thru 5-15.
Beausoliel, Jr. Robert W.
Iqbal Nadeem
Lucent Technologies - Inc.
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