Method and apparatus for parameter measurement of coupled-dual r

Details Method and apparatus for parameter measurement of coupled-dual r Method and apparatus for parameter measurement of coupled-dual r

1990-02-16

1991-09-17

Wieder, Kenneth

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Piezoelectric crystal testing

324652, 324649, G01R 2922

Patent

active

050498282

ABSTRACT:
In coupled-dual resonator crystals, key parameters, such as resonator frequencies and synchronous peak separation frequency, are determined using a four frequency measuring process and apparatus wherein additional impedance is connected in parallel with the driving point impedance of the input resonator so as to allow the measurement of the critical frequencies above about 45 MHz.

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G. E. Roberts, Proc. 33rd Ann. Symp. on Freq. Contr., "A four-frequency process for accurately measuring coupled-dual resonator crystal", May, 1979, pp. 159-165.
G. E. Roberts, IEEE Trans. on Ultrasonics, Ferroelectrics, & Freq. Control, "The four-frequency process for coupled duals using error-corrected S-parameter measurements," vol. 35, No. 3, May, 1988, pp. 306-314.

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