Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1986-09-03
1988-02-02
Rosenberger, R. A.
Optics: measuring and testing
By polarized light examination
With light attenuation
G01B 1114
Patent
active
047226056
ABSTRACT:
A Moire system for linear measurement of an unknown distance defined by two surfaces, a collimated light source, a first grating between light source and the surfaces, a second grating positioned to receive collimated light from the surfaces after the light has reached the surfaces from the first grating, the first and second gratings being rotated relative to each other by a small angle .theta., a screen located after the second grating for receiving Moire patterns caused by the first and second gratings, and a mechanism for shifting the patterns as a function of the unknown distance whereby measurements of the amount of shifting is determinative of the unknown distance.
REFERENCES:
patent: 2375356 (1945-05-01), Flint
patent: 2621808 (1952-12-01), Blakeney
patent: 3930732 (1976-01-01), Holly
Theocaris et al., Slope Measurement by Means of Moire Fringes, Journal of Scientific Instrumentation, 1965, vol. 42, #81, pp. 607-610.
Fry et al., Analyzing Rapid Surface Motions with Moire Fringes, Proceedings of the 12th International Congress on High Speed Photography, Aug., 1976, SPIE, vol. 97, High Speed Photography, pp. 30-36.
Kafri et al. "Reflective Surface Analysis Using Moire Deflectometry" Applied Optics, pp. 3098-3099, vol. 20, No. 18, Sep. 15, 1981.
"Moire Technique for Measuring Liquid Level" Livnat et al., Applied Optics, vol. 21, #16, Aug. 15, 1982.
"Moire Fringe Multiplication Technique for Measuring Small Displacements" Shing Fong Su Applied Optics, vol. 22, #19, Oct. 1983.
Kafri Oded
Livnat Aminadav
Cooper Crystal D.
Rosenberger R. A.
The State of Israel, Atomic Energy Commission
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