Optical: systems and elements – Diffraction – Using fourier transform spatial filtering
Patent
1990-02-05
1992-01-07
Arnold, Bruce Y.
Optical: systems and elements
Diffraction
Using fourier transform spatial filtering
364822, 382 31, G02B 2746, G06K 900
Patent
active
050785010
ABSTRACT:
The conformance of an unknown object to predetermined characteristics is evaluated through a characteristic signature, using its transform image. The presence at an inspection station of each successive one of the objects to be inspected is detected. The inspection system includes a rotatable disk having mask apertures that move into the line of sight of a light detector. Signals produced by scanning of timing marks upon the disk reflect which one of the plurality of masks is present in the optical path, and the photodetector determines the intensity of the transform image sampled by said mask means. The signals representing these intensities, correlated to the domain from which they emanate, are collected to form a signature for the object. This signature is compared to a known signature.
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Buck Robert D.
Haran Terence M.
Hekker Roeland M. T.
Livny Izhak M.
Arnold Bruce Y.
E. I. Du Pont de Nemours and Company
Lerner Martin
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