Optics: measuring and testing – Material strain analysis – With polarized light
Patent
1988-03-11
1989-03-14
Willis, Davis L.
Optics: measuring and testing
Material strain analysis
With polarized light
324 96, 324501, 356365, G01N 2123
Patent
active
048120375
ABSTRACT:
An apparatus for optically detecting electronic circuit malfunctions includes a light transmitting plate member which is adapted to be positioned adjacent to a plurality of individual electronic circuit elements positioned on a printed circuit board. First and second polarizing filters are positioned adjacent to opposing edges of the light transmitting plate. As the individual electronic circuit elements positioned on the circuit board are operated, the nonuniform heating of the light transmitting plate by the circuit elements produces mechanical stresses within the plate. As monochromatic or white light is passed through the pair of polarizing filters and the light transmitting plate, a light/dark striated pattern of light is produced on the surface of the second polarizing filter. By recording the pattern of a properly operating printed circuit board, a reference pattern may be obtained. Subsequent patterns of light are compared to the reference pattern in order to detect differences between patterns. These differences indicate a change in the temperature of an electronic circuit element with respect to its proper operating temperature, and further indicates a possible malfunction of that individual circuit element.
REFERENCES:
patent: 3934199 (1976-01-01), Channin
patent: 4428017 (1984-01-01), Vaerewyck et al.
Boenning Robert A.
Riedel Ernest P.
Koren Matthew W.
Spadacene J. C.
Westinghouse Electric Corp.
Willis Davis L.
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