Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2008-09-23
2008-09-23
Chowdhury, Tarifur R (Department: 2886)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S450000, C702S159000
Reexamination Certificate
active
11373862
ABSTRACT:
A method and apparatus for analyzing a surface of a test object employs apparatus with a scanning interferometry system which generates a windowed interferometric signal from the surface of a test object to characterize the surface of the test object.
REFERENCES:
patent: 5190614 (1993-03-01), Leach et al.
patent: 5398113 (1995-03-01), de Groot
patent: 6545763 (2003-04-01), Kim et al.
patent: 7068376 (2006-06-01), De Groot
patent: 2005/0088663 (2005-04-01), De Groot et al.
Determination of fringe order in white-light interference microscopy, Applied Optics, Aug. 1, 2002.
Signal Analysis, IEEE Press, Wiley-Interscience.
The Handbook of Formulas and Tables for Signal Processing, Alexander Poularikas, CRC Press, IEEE Press.
Optical Shop Testing, 2ndedition, Daniel Malacara, Wiley-Interscience.
Principles of Optics, Max Born et al., 7thexpanded edition, Cambridge University Press.
Thin Film Optical Filters, 3rdedition, H.A. Macleod, Institute of Physics Publishing, Bristol and Philadelphia.
Contributions to Interference Microscopy, Wolfgang Krug et al.
Mirau Correlation Microscope, Gordon Kino et al., Applied Optics, Sep. 10, 1990, vol. 29, No. 26.
Profilometry with a Coherence Scanning Microscope, Byron Lee et al., Applied Optics, Sep. 10, 1990, vol. 29, No. 26.
Formulation for stable and efficient implementation of the rigorous coupled-wave analysis of binary grating, M.G. Moharam et al., Optical Society of America, 1995, vol. 12, No. 5.
Stable implementation of the rigorous coupled-wave analysis for surface-relief gratings; enhance transmittance matrix approach, M.G. Moharam et al., Optical Society of America, vol. 12, No. 5, May 1995.
On the Use of Windows for Harmonic Analysis with the Discrete Fourier Transform, Fredric Harris, Proceedings of the IEEE, vol. 66, No. 1, Jan. 1978.
Freischlad Klaus
Tang Shouhong
Caven & Aghevli LLC
Chowdhury Tarifur R
Cook Jonathon D
KLA-Tencor Technologies Corporation
LandOfFree
Method and apparatus for optically analyzing a surface does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for optically analyzing a surface, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for optically analyzing a surface will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3942449