Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2006-10-31
2006-10-31
Stafira, Michael P. (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
C356S237200, C451S006000
Reexamination Certificate
active
07130038
ABSTRACT:
An optical probe (and method) for measuring a surface in an environment containing a first substance, includes a light source for transmitting a light onto an area of the surface to obtain a measurement, a source of the first substance including one of a fluid and a gas for displacing a second substance from an area of the surface receiving the light, and a measuring device for receiving the light being reflected from the surface and for determining a measurement of the surface based upon the reflected light.
REFERENCES:
patent: 5637029 (1997-06-01), Lehane
patent: 6319093 (2001-11-01), Lebel et al.
patent: 6676766 (2004-01-01), Harano et al.
Lebel Richard J.
Maurer Fredrik
Smith, Jr. Paul H.
Van Kessel Theodore G.
Wickramasinghe Hematha K.
Kaufman, Esq Stephen C.
Stafira Michael P.
Valentin, II Juan D.
LandOfFree
Method and apparatus for optical film measurements in a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for optical film measurements in a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for optical film measurements in a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3620614