Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2005-11-22
2005-11-22
Lauchman, Layla G. (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
C451S006000, C356S237200
Reexamination Certificate
active
06967715
ABSTRACT:
An optical probe (and method) for measuring a surface in an environment containing a first substance, includes a light source for transmitting a light onto an area of the surface to obtain a measurement, a source of the first substance including one of a fluid and a gas for displacing a second substance from an area of the surface receiving the light, and a measuring device for receiving the light being reflected from the surface and for determining a measurement of the surface based upon the reflected light.
REFERENCES:
patent: 5637029 (1997-06-01), Lehane
patent: 6319093 (2001-11-01), Lebel et al.
Lebel Richard J.
Maurer Fredrik
Smith, Jr. Paul H.
Van Kessel Theodore G.
Wickramasinghe Hematha K.
International Business Machines - Corporation
Kaufman, Esq. Stephen C.
Lauchman Layla G.
McGinn IP Law Group PLLC
Valentin, II Juan D.
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