Method and apparatus for optical examination of an object partic

Details Method and apparatus for optical examination of an object partic Method and apparatus for optical examination of an object partic

1988-02-08

1989-03-07

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

250572, G01N 1506

Patent

active

048108952

ABSTRACT:
A method and apparatus for moire ray deflection mapping for determining properties of an object in which a point source of light producing a diverging beam of direct light is passed through a first optical system including the object to be examined, which system retraces the light in the form of a converging beam of reflected light from the examined object back towards the point source. The converging beam of reflected light is intercepted before reaching the point source and is passed through a second optical system which collimates the beam of reflected light. The collimated beam is then directed through first and second gratings at a preselected angular orientation with respect to each other to produce moire fringe patterns providing an indication of the properties of the examined object. An important advantage in the above novel method is that the same setup can be used for measurements of both phase objects and specular surfaces.

REFERENCES:
patent: 4139291 (1979-02-01), Parthasarathy
patent: 4158507 (1979-06-01), Himmel
patent: 4249823 (1981-02-01), Task
patent: 4459027 (1984-07-01), Kafri et al.
patent: 4569590 (1986-02-01), Karny et al.
patent: 4577940 (1986-03-01), Krasinski et al.
patent: 4611917 (1986-09-01), Robieux et al.
patent: 4639132 (1987-01-01), Glatt et al.

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