Method and apparatus for on die testing

Details Method and apparatus for on die testing Method and apparatus for on die testing

1996-04-30

1999-02-09

Beausoliel, Jr., Robert W.

Excavating

324757, G01R 3128

Patent

active

058704086

ABSTRACT:
Circuits and methods of testing an integrated circuit die are disclosed. Active logic setting circuits are incorporated into input cells of a die. During testing, the active logic setting circuits weakly drive the input cells to a definite logic level. Therefore, the necessity of connecting probes to all of the input pads to prevent floating signals in the die is eliminated. Furthermore, during normal operations the active logic setting circuits have little or no effect on the performance of the die.

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patent: 5557573 (1996-09-01), McClure
patent: 5559744 (1996-09-01), Kuriyama et al.

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