Method and apparatus for on-chip phase error measurement to...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Synchronizing

Reexamination Certificate

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C327S147000

Reexamination Certificate

active

07999583

ABSTRACT:
An apparatus includes a phase-locked loop (PLL) circuit including a phase-frequency detector configured to output phase error signals. A phase error monitor circuit is configured to determine instantaneous peak phase error by logically combining the phase error signals and comparing pulse widths of the logically combined phase error signals to a programmable delay time at each reference clock cycle to determine instantaneous phase error change. A storage element is configured to store the instantaneous phase error change.

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