Method and apparatus for on-chip dynamic temperature tracking

Details Method and apparatus for on-chip dynamic temperature tracking Method and apparatus for on-chip dynamic temperature tracking

2007-03-27

2007-03-27

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Temperature measuring system

Reexamination Certificate

active

11052491

ABSTRACT:
A method, computer program product, and apparatus for obtaining a digital temperature reading from within an integrated circuit. In a preferred embodiment, a temperature-stable constant current source is applied to a tapped series of resistors to obtain a set of stable reference voltages. These reference voltages are fed into an analog multiplexer, which selects a single reference voltage to output to a comparator. A PTAT (proportional to absolute temperature) voltage signal is also applied to the comparator, so that the output of the comparator indicates a comparison between the selected reference voltage and the PTAT signal. A digital temperature reading is obtained by using finite-state control to apply test values to the multiplexer in order to search for a value corresponding to a reference voltage that is closest to the value of the PTAT signal. The value that is found is a digital representation of the temperature.

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