Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1998-04-30
2000-08-01
Ballato, Josie
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
324 7619, G01R 2700
Patent
active
060971940
ABSTRACT:
The invention relates to a time domain method for obtaining transfer characteristics of a device under test (DUT). The method comprises the steps of applying a sine sweep and a cosine sweep to an input of the DUT, and measuring response signals at an output of the DUT. The sine sweep and cosine sweep together establish a complex input signal, whereby to each instant there is related a particular frequency. Similarly, the respective response signals together establish a complex response signal. The magnitudes and phases of both complex signals are calculated and the transfer characteristics of the DUT then follow from the magnitude ratio and the phase difference of the input signal and the response signal. The invention also relates to an arrangement for testing transfer characteristics of a DUT and to an integrated circuit comprising the necessary elements for testing a subcircuit contained therein.
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Janssen Augustus J. E. M.
Looijer Marc T.
Seuren Gerardus P. H.
Zwemstra Taco
Ballato Josie
Nguyen Vincent Q.
U.S. Philips Corporation
Wieghaus Brian J.
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