Optics: measuring and testing – By polarized light examination
Reexamination Certificate
2005-11-01
2005-11-01
Stafira, Michael P. (Department: 2877)
Optics: measuring and testing
By polarized light examination
Reexamination Certificate
active
06961123
ABSTRACT:
An apparatus includes a first section operable to detect polarization-sensitive radiation emitted by an object, and a second section operable to determine a Jones matrix based on information obtained by the first section from the polarization-sensitive radiation. The second section thereafter transforms the Jones matrix into a Mueller matrix, the Mueller matrix being representative of properties of the object.
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Jiao Shuliang
Wang Lihong
Baker & Botts L.L.P.
Stafira Michael P.
The Texas A&M University System
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