Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Reexamination Certificate
2006-09-19
2006-09-19
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
Reexamination Certificate
active
07109724
ABSTRACT:
An apparatus for contactless measurement of sheet charge density and mobility includes a microwave source, waveguide, first, second and third detectors, and an eccentric bore mount for adjusting the sample. A circular waveguide, carrying the TE11mode, terminates by the sample behind which a short is located. A magnetic field is applied perpendicular to the plane of the sample, and an incident TE11wave causes an ordinary reflected wave and a reflected wave caused by the Hall effect. A first detector measures the ordinary reflected wave, which has the same polarization as the incident wave. A seperate probe measures the reflected wave caused by the Hall effect, whose polarization is perpendicular to the former. This reflected wave is detected, and the output combined with an attenuated; phase shifted, portion of the forward power at a single detector, to eliminate by destructive interference any spurious incident signal at said detector.
REFERENCES:
patent: 4087745 (1978-05-01), Kennedy et al.
patent: 4605893 (1986-08-01), Braslau
patent: 5103182 (1992-04-01), Moslehi
patent: 5179333 (1993-01-01), Washizuka et al.
patent: 5196786 (1993-03-01), Usami et al.
patent: 5781018 (1998-07-01), Davidov et al.
patent: 6100703 (2000-08-01), Davidov et al.
patent: 6771372 (2004-08-01), Traber
PCT/US05/28254, PCT Search Report dated Dec. 5, 2005.
Eberhardt Nikolai
Licini Jerome C.
Murphy Steven C.
Zuidervliet William
Duane Morris
Lehighton Electronics Inc.
Nguyen Vincent Q.
Teresinski John
LandOfFree
Method and apparatus for nondestructive measurement and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for nondestructive measurement and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for nondestructive measurement and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3551827