Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-12-12
2006-12-12
Hoff, Marc C. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S122000
Reexamination Certificate
active
07149636
ABSTRACT:
Systems and methods for improved power profiling of embedded applications are presented. These inventions provide the ability to unobtrusively measure the power consumption of an embedded application as the application is executing on its target hardware. The unobtrusiveness is achieved by using programmable emulation circuitry in the target system processor and available device debug terminals on the test port.
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Anderson Edward A.
Cooper Gary A.
Cyran Robert J.
Kolonay Paul
Strane Roger
Brady W. James
Gutierrez Anthony
Hoff Marc C.
Marshall, Jr. Robert D.
Telecky , Jr. Frederick J.
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