Method and apparatus for non-obtrusive power profiling

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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C702S122000

Reexamination Certificate

active

07149636

ABSTRACT:
Systems and methods for improved power profiling of embedded applications are presented. These inventions provide the ability to unobtrusively measure the power consumption of an embedded application as the application is executing on its target hardware. The unobtrusiveness is achieved by using programmable emulation circuitry in the target system processor and available device debug terminals on the test port.

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