Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2001-09-04
2004-10-12
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C073S204230, C324S754120, C374S043000
Reexamination Certificate
active
06804622
ABSTRACT:
BACKGROUND OF THE INVENTION
The present invention relates generally to thermal inspection methods and apparatus and, more particularly, to non-destructive thermal inspection methods and apparatus.
Currently, most internally cooled components are inspected by various techniques using flow checks, dimensional gauges and other visual methods. Industry typically relies on these methods to determine the quality (pass/fail) of each part as compared to a nominal standard part or a specification. In this practice there is no quantitative way to distinguish between two parts that may have very different internal thermal performance, but which flow the same amount and otherwise pass all external dimensional tests.
Accordingly, there is a need in the art for an improved method of thermal inspection and specifically, there is a need for a quantitative non-destructive thermal inspection method and apparatus.
BRIEF SUMMARY OF THE INVENTION
A method of quantitative non-destructive thermal inspection of an article having at least one internal cavity comprises the steps of inputting physical properties of the article, measuring thermal characteristics of the article, and calculating heat transfer coefficients of the internal cavity.
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Bunker Ronald Scott
Nirmalan Nirm Velumylum
Schick Louis Andrew
Barlow John
Cabou Christian G.
General Electric Company
Le John H
Patnode Patrick K.
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