Method and apparatus for non-destructive testing of beam-lead in

Details Method and apparatus for non-destructive testing of beam-lead in Method and apparatus for non-destructive testing of beam-lead in

1979-12-26

1981-08-11

Myracle, Jerry W.

Measuring and testing

Specimen stress or strain, or testing by stress or strain...

By loading of specimen

228104, G01N 308

Patent

active

042827590

ABSTRACT:
A method and apparatus for non-destructive testing of beam-lead integrated ircuit connections in which each of the leads from a chip beam-lead device has a pull tab made interval therewith with a weakened area and means for connecting a pull tool thereto to test the bond strength between the individual lead and the conductor to which the lead is bonded to determine if a predetermined bond exist between the lead and the conductor.

REFERENCES:
patent: 3634930 (1972-01-01), Cranston
patent: 3945248 (1976-03-01), West

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