Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2005-12-13
2005-12-13
Kim, Ahshik (Department: 2876)
Optics: measuring and testing
Inspection of flaws or impurities
C356S237200, C356S237400, C356S239800, C356S243400
Reexamination Certificate
active
06975391
ABSTRACT:
Using an image signal acquired by picking up a sample to be inspected by a color video camera, penetrant inspection and magnetic-particle inspection, which are non-destructive inspections, are carried out so that deficiency candidates, including a pseudo deficiency, are automatically detected and displayed on a screen. A real deficiency can be detected from the displayed deficiency candidates. As image data is stored in memory means, information of a deficiency can be repeatedly reproduced on the screen. In the penetrant inspection, the chromaticity at each position on an image is acquired, a deficiency candidate is extracted based on the chrominance, and the deficiency is distinguished from a pseudo deficiency based on the differential value of the chrominance. A polarization filter eliminates regular reflection originating from illumination in the penetrant inspection, and an ultraviolet-rays cutting filter prevents noise in the magnetic-particle inspection. Both inspections can be carried out with a single probe.
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Asano Toshio
Sakai Kaoru
Taguchi Tetsuo
Tanaka Isao
Antonelli Terry Stout & Kraus LLP
Hitachi , Ltd.
Kim Ahshik
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