Method and apparatus for non-destructive detection of hidden fla

Details Method and apparatus for non-destructive detection of hidden fla Method and apparatus for non-destructive detection of hidden fla

1999-05-14

2000-12-05

Bruce, David V.

X-ray or gamma ray systems or devices

Specific application

Absorption

378 98, G01B 1506

Patent

active

061576999

ABSTRACT:
X- or .gamma.-radiation is utilized during non-destructive examination of a sample, to detect hidden flaws in a test sample by generating a number referred to as a single figure-of-merit. The figure-of-merit is obtained by comparing the set of responses obtained from radiation emanating from a standard sample with a set of responses obtained from radiation emanating from a test sample. The resulting figure-of-merit is then compared with a reference value as an indicator of the presence of a flaw.

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patent: 4870669 (1989-09-01), Anghaie
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patent: 5430787 (1995-07-01), Norton
patent: 5684851 (1997-11-01), Kurbatov
"A Limited-scan Backscatter Technique for Detection of Hidden Corrosion" Yacout et al, Appl. Radiat. Isot. vol. #48 10-12 pp. 1313-1320, 1997.
"Towards Quantitative Non-Destructive Evaluation of Aging Aircraft" Achenbach, Springer Series in Computational Mechanics, Germany 1991.

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