Method and apparatus for non-contact testing and diagnosing...

Details Method and apparatus for non-contact testing and diagnosing... Method and apparatus for non-contact testing and diagnosing...

2006-10-17

2006-10-17

Benson, Walter (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S758010

Reexamination Certificate

active

07123022

ABSTRACT:
A device for enabling testing of electrical paths through a circuit assembly is presented. The device may include a non-contact connector test probe for a testing a connector of the circuit assembly. A method for testing continuity of electrical paths through a circuit assembly is presented. In the method, one or more nodes of the circuit assembly are stimulated, connector pins of a connector on the circuit assembly are capacitively coupled to a non-contact connector test probe, and an electrical characteristic is measured by a tester coupled to the non-contact connector test probe to determine continuity of electrical paths through the circuit assembly.

REFERENCES:
patent: 5151659 (1992-09-01), Tanaka et al.
patent: 5420500 (1995-05-01), Kerschner
patent: 5498964 (1996-03-01), Kerschner et al.
patent: 5557209 (1996-09-01), Crook et al.
patent: 6201398 (2001-03-01), Takada

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